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The spectral (reflectance) non-uniformity of the large-aperture reflective optical element completed by the optical coating is an important technical parameter, and its measurement accuracy is extremely demanding. Only meet certain technical requirements can be used in the system in order to achieve the quality of guaranteed reflective optics to meet the normal operation of the system.
It is reported that this test technology is provided by the Institute of Optoelectronics thin film optical test research team to provide a test technology platform, the main technical breakthrough is to achieve a two-dimensional high resolution imaging measurement of the reflectivity distribution of large-aperture reflective elements. At the same time, three-dimensional test results of time-exponential decay fit curves and specular reflectance scans for reflectance measurements can also be provided. The test device also provides important technical support for the evaluation and optimization of the reflectivity of large-aperture optical components, and helps the rapid development of China's optical component industry.
This research project has been funded by the Chinese Academy of Sciences, and the release of research results has triggered widespread industry attention.
Research Institute of Optoelectronics has achieved breakthrough in high-precision measurement
[China Instruments Network Instrument Development] Optical components are closely related to optical research instruments, affecting all aspects of social life. According to the Institute of Optoelectronic Technology of the Chinese Academy of Sciences (hereinafter referred to as the Institute of Optoelectronics), recently, in order to ensure the accurate measurement of the emissivity of large-aperture reflective elements, Optoelectronics is based on the basis of a test technology platform and has high reflectivity in large-aperture reflective optical components. A major breakthrough has been made in sex test research.